It has been announced by Synopsys, that the DesignWare STAR Memory System solution now offers new memory built-in self-test (BIST), repair, and diagnostic capabilities for embedded MRAM (eMRAM)-based designs, with initial support for GLOBALFOUNDRIES (GF) eMRAM on the 22FDX process.
The STAR Memory System’s new algorithms target failure mechanisms of embedded MRAM and other types of non-volatile memories during production and in-field test. Support for multiple background patterns and complex addressing modes accelerates automated test equipment (ATE) vector generation, resulting in the highest test coverage for eMRAM, maximized manufacturing yield, and improved system-on-chip (SoC) reliability.
In addition, augmented design acceleration capabilities in the STAR Memory System automate the test and repair logic’s planning, generation, insertion, and verification steps for embedded MRAMs to reduce the overall integration effort.
Michael Mendicino, Vice President of Product Management at GF, stated: “GF’s eMRAM technology on the 22FDX platform significantly improves power, density, write-speed, and data retention in embedded applications for battery-powered IoT and autonomous vehicle radar SoCs. With the Synopsys DesignWare STAR Memory System and its full suite of post-silicon debug and diagnostic capabilities for embedded MRAM, designers can build greater functionality into their MCUs and SoCs while enhancing performance and power efficiency.”
The DesignWare STAR Memory System is an automated pre- and post-silicon memory test, diagnostic, and repair solution that enables designers to implement high test coverage, reduce design time, lower manufacturing test costs, and maximize manufacturing yield. Synopsys employs rigorous simulation and silicon characterization methods to identify prevalent memory defect mechanisms at every process node for different memory architectures and then develops the test algorithms to detect them. The STAR Memory System solution can test, diagnose, and debug a broad suite of memories including MRAM, SRAM, register file, ROM, CPU/GPU cache, CAM, e-flash, and off-chip memories such as DDR and LPDDR.
John Koeter, Vice President of Marketing for IP at Synopsys, added: “As SoC designers take advantage of the performance, endurance, and technology scaling advantages of embedded MRAM, they will require an integrated test solution to help manage the overall area, power, and yield of their SoCs. With the latest enhancements to the DesignWare STAR Memory System, Synopsys is providing the industry with the first commercially available test and repair solution that addresses the specific test coverage needs of eMRAM-based designs, including those targeting GF’s 22FDX process.”
